Why does the IEEE 1149.6 JTAG testing fail when using pre-configuration BSDL files on transceiver I/O pins? - Why does the IEEE 1149.6 JTAG testing fail when using pre-configuration BSDL files on transceiver I/O pins? Description IEEE 1149.6 JTAG testing for transceiver I/O pins will fail if the device is not configured . Resolution Prior to attempting to perform IEEE 1149.6 JTAG testing on transciever pins, you must first configure the device with a valid bitstream. JTAG boundary scan support for transceivers must use post-configuration BSDL files. This applies to Altera® transceiver capable devices supporting IEEE 1149.6 BSDL Files . Custom Fields values: ['novalue'] Troubleshooting novalue False ['novalue'] ['novalue'] novalue novalue ['Programmable Logic Devices'] ['novalue'] ['novalue'] ['novalue'] - 2021-08-25

external_document