Flash Memory Corrupted - Flash Memory Corrupted Description The contents of flash memory might be corrupted when you erase or write to the memory using the Nios II HAL driver for the Altera serial flash controller, also known as the EPCQ controller. Memory corruption can occur two ways: The EPCQ erase function incorrectly assumes that the location is specified by a sector number, but the correct generic HAL API definition requires a sector offset. The write function writes the specified data correctly, but writes beyond the length specified in its arguments, corrupting data directly after the modified data. Resolution Upgrade to the Nios II Embedded Design Suite v15.0 or later. Custom Fields values: ['novalue'] Troubleshooting novalue True ['novalue'] ['FPGA Dev Tools Quartus II Software'] 15.0 14.1 ['Programmable Logic Devices'] ['novalue'] ['Configuration Device EPCQ'] ['novalue'] - 2021-08-25

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